Translator Disclaimer
3 August 2007 Landform classification based on adjacency index of feature lines
Author Affiliations +
Landform feature points and lines have been used as basic landform descriptors of landform skeleton in many fields, including surveying, simulation of hydrology, landform classification, and vegetation mapping. With the objective of landform classification from DEMs, an approach has been put forward based on topological parameters and the extended ones. The methodology for landform classification is implemented as a three-step process: choice of appropriate scale for analysis, extraction of feature lines, and quantitative measurement of feature lines. Five parameters, entropy of graphs, edge adjacency index and elevation difference weighted adjacency index, number graphs and density of graphs are used to classify different landforms. The result shows that topological index and descriptive parameters of graphs, aided by mean elevation is capable to classify of the high mountain, Loess Mao, Loess Liang and Low mountain.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mingliang Luo, Guoan Tang, and Jieyu Zhou "Landform classification based on adjacency index of feature lines", Proc. SPIE 6751, Geoinformatics 2007: Cartographic Theory and Models, 67511D (3 August 2007);

Back to Top