Comparison of urban heat island retrieval method from Landsat TM thermal data

Xiuying Zhang; Ke Wang; Yongjun Song

doi:10.1117/12.760782

26 July 2007 Comparison of urban heat island retrieval method from Landsat TM thermal data

Xiuying Zhang, Ke Wang, Yongjun Song

Proceedings Volume 6752, Geoinformatics 2007: Remotely Sensed Data and Information; 67522A (2007) https://doi.org/10.1117/12.760782
Event: Geoinformatics 2007, 2007, Nanjing, China

Abstract

Landsat TM/ETM+ data have been proved a useful tool to measure urban heat island (UHI) effect. In this paper, five methods - DN value or at-sensor brightness temperature, land surface temperature (LST) retrieved by spectral emissivity correction, mono-window algorithm, generalized single-channel method with and without near-surface temperature, to denote the spatial distribution of the UHI effect from the thermal band of ETM+ data are compared. The land surface emissivity (LSE) values required to retrieve LST was estimated from the NDVI Thresholds Methods, combing with the other six bands provided by the ETM+ data. Finally, we presented a comparison between the five temperatures retrieved by the five algorithms over Nanjing City. The results showed that the three methods of mono-window algorithm and the generalized single-channel method with or without near-surface temperature obtained the similar UHI effect results; DN value also owned high correlation coefficient with LSTs by the three mono-channel methods, so it could be used to denote the spatial variation of UHI effect in some degree; and the value of spectral emissivity corrected LST was much different with that from other four methods.

Citation Download Citation

Xiuying Zhang, Ke Wang, and Yongjun Song "Comparison of urban heat island retrieval method from Landsat TM thermal data", Proc. SPIE 6752, Geoinformatics 2007: Remotely Sensed Data and Information, 67522A (26 July 2007); https://doi.org/10.1117/12.760782

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KEYWORDS

Earth observing sensors

Landsat

Thermal effects

Sensors

Vegetation

Temperature metrology

Algorithm development

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