12 October 2007 Design of high sensitivity refractometer based on temperature independent TE and TM modes in open top ridge waveguides
Author Affiliations +
Proceedings Volume 6770, Fiber Optic Sensors and Applications V; 67700B (2007) https://doi.org/10.1117/12.732536
Event: Optics East, 2007, Boston, MA, United States
Abstract
A technique for creating a temperature insensitive refractometer that utilizes TE and TM modes in an open-top ridge waveguide design is presented. By using the TE mode resonance as a temperature reference, the relative shift of the TM mode can be monitored in order to measure the refractive index of liquids under test. Specifically, the device fabricated here produces a relative resonance shift of 1 pm for every 1×10-4 of measured index change, with a temperature sensitivity less than 0.2 pm/°C. To increase the sensitivity of these devices, a theoretical model is developed to investigate the performance of some potential waveguide structures. Relationships between the waveguide core size, refractive index distribution, as well as the relative evanescent sensitivity of TE and TM modes are examined.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
X. Dai, X. Dai, S. J. Mihailov, S. J. Mihailov, R. B. Walker, R. B. Walker, C. Chen, C. Chen, J. Albert, J. Albert, } "Design of high sensitivity refractometer based on temperature independent TE and TM modes in open top ridge waveguides", Proc. SPIE 6770, Fiber Optic Sensors and Applications V, 67700B (12 October 2007); doi: 10.1117/12.732536; https://doi.org/10.1117/12.732536
PROCEEDINGS
6 PAGES


SHARE
Back to Top