Measurement system for acquiring gain distribution of avalanche photodiodes at low gains

Kenji Tsujino; Makoto Akiba; Masahide Sasaki

doi:10.1117/12.733873

15 October 2007 Measurement system for acquiring gain distribution of avalanche photodiodes at low gains

Kenji Tsujino, Makoto Akiba, Masahide Sasaki

Proceedings Volume 6771, Advanced Photon Counting Techniques II; 67710Z (2007) https://doi.org/10.1117/12.733873
Event: Optics East, 2007, Boston, MA, United States

Abstract

A measurement system is described for acquiring the gain distributions of avalanche photodiodes (APDs) in a range of low average gain. The system is based on an ultralow-noise capacitive transimpedance amplifier to readout the charges generated in an APD. The low noise level of the readout circuit about 7 electrons at the sampling rate of 200 Hz enables us to characterize the gain distributions. The gain distribution of a commercial silicon (Si) APD measured at gain of 3.29 using this system is presented.

Citation Download Citation

Kenji Tsujino, Makoto Akiba, and Masahide Sasaki "Measurement system for acquiring gain distribution of avalanche photodiodes at low gains", Proc. SPIE 6771, Advanced Photon Counting Techniques II, 67710Z (15 October 2007); https://doi.org/10.1117/12.733873

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