9 January 2008 Research of signal denoising method on an improved wavelet threshold
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Proceedings Volume 6794, ICMIT 2007: Mechatronics, MEMS, and Smart Materials; 67941E (2008) https://doi.org/10.1117/12.784390
Event: ICMIT 2007: Mechatronics, MEMS, and Smart Materials, 2007, Gifu, Japan
Abstract
Based on the Multi-analysis wavelet threshold denosing method which is put forward by D. L. Dohono and I. M. Johnstone, a new threshold function is posed. This new threshold function has many advantages over the classical soft and hard threshold function. It is clear in physics meaning and simple in expression. The experimental results show that this improved method is effective in removing white noise, and gives better RMSE performance and SNR gains than soft and hard threshold methods, and makes it possible to embody the advantages of the wavelet threshold denoising method more fully.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chengbo Yu, Chengbo Yu, Huafeng Qin, Huafeng Qin, Lian Zhang, Lian Zhang, } "Research of signal denoising method on an improved wavelet threshold", Proc. SPIE 6794, ICMIT 2007: Mechatronics, MEMS, and Smart Materials, 67941E (9 January 2008); doi: 10.1117/12.784390; https://doi.org/10.1117/12.784390
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