9 January 2008 Four-tip scanning tunneling microscope for measuring transport in nanostructures
Author Affiliations +
Abstract
By controlling four tips independently, mechanically and electrically, in an organic manner, we can do novel measurements in nanometer scales, which are impossible by single-tip scanning tunneling microscopes (STM). The four-tip STM makes possible to measure electrical properties of nano-scale devices and materials, and also to directly image Green's function that represents propagation of electron wavefunction. We can now bring two tips as close as 20 nm to each other by using conductive carbon-nanotube tips in the four-tip STM. A new controller which drives the four tips with a single computer is another important clue for practical use of the four-tip STM.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shuji Hasegawa, Shuji Hasegawa, Shinya Yoshimoto, Shinya Yoshimoto, Rei Hobara, Rei Hobara, } "Four-tip scanning tunneling microscope for measuring transport in nanostructures", Proc. SPIE 6800, Device and Process Technologies for Microelectronics, MEMS, Photonics, and Nanotechnology IV, 68000G (9 January 2008); doi: 10.1117/12.764823; https://doi.org/10.1117/12.764823
PROCEEDINGS
12 PAGES


SHARE
Back to Top