28 January 2008 Characterization of reflection scanner uniformity
Author Affiliations +
Abstract
A flatbed reflection scanner is a tempting device to use as a surrogate for a microdensitometer in the evaluation of print image quality. Since reflection scanners were never designed with this purpose in mind, many concerns exist regarding their usefulness as a microdensitometer surrogate. This paper addresses the concerns regarding scan uniformity that must be addressed in order to qualify a reflection scanner for use in print image quality evaluation.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric K. Zeise, Eric K. Zeise, William C. Kress, William C. Kress, Donald R. Williams, Donald R. Williams, } "Characterization of reflection scanner uniformity", Proc. SPIE 6808, Image Quality and System Performance V, 680803 (28 January 2008); doi: 10.1117/12.772618; https://doi.org/10.1117/12.772618
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT

W1.1 macro uniformity
Proceedings of SPIE (January 18 2009)
A new method for in flight radiometric noise assessment ...
Proceedings of SPIE (November 03 2004)
JPEG 2000 in advanced ground station architectures
Proceedings of SPIE (November 28 2000)
Scanners for analytic print measurement the devil in the...
Proceedings of SPIE (January 28 2007)

Back to Top