28 January 2008 Autonomously detecting the defective pixels in an imaging sensor array using a robust statistical technique
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Abstract
We propose a statistical technique for autonomously detecting defective pixels in a CCD sensor array. Our data-driven analysis technique can autonomously identify a wide range of faulty and 'suspect' pixels (hypo-sensitive or hyper-sensitive pixels), without the need for any defect model or prior knowledge of the nature of pixel faults. We apply our technique to the autonomous detection of the defective pixels in regular images captured with a camera, equipped with a CCD.
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Siddhartha Ghosh, Ian Marshall, and Alex Freitas "Autonomously detecting the defective pixels in an imaging sensor array using a robust statistical technique", Proc. SPIE 6808, Image Quality and System Performance V, 680813 (28 January 2008); doi: 10.1117/12.765147; https://doi.org/10.1117/12.765147
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