26 February 2008 Directional filter banks for detecting un-patterned TFT-LCD defect
Author Affiliations +
Proceedings Volume 6813, Image Processing: Machine Vision Applications; 68130U (2008); doi: 10.1117/12.766182
Event: Electronic Imaging, 2008, San Jose, California, United States
Abstract
The thin film transistor liquid crystal display (TFT-LCD) has become an actively used front of panel display technology with an increasing market. Intrinsically there is a region of non uniformity with low contrast that to human eye is perceived as a defect. Because the grey-level difference between the defect and the background is small, the conventional edge detection techniques are hardly applicable to detect these low contrast defects. Although several effort were dedicated in classifying the patterned TFT-LCD defects, only few researches were conducted on detecting the unpatterned TFT-LCD defects that accounts for approximately 15% of all defects produced during the manufacturing stages. This paper proposes a detection method for the un-patterned TFT-LCD defects by using the directional filter bank (DFB), Shen-Castan filter and maximum Feret's diameter. The effectiveness of the proposed method is tested through the experiment using real TFT-LCD panel images.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
No Kap Park, Hye Won Kim, Suk In Yoo, "Directional filter banks for detecting un-patterned TFT-LCD defect", Proc. SPIE 6813, Image Processing: Machine Vision Applications, 68130U (26 February 2008); doi: 10.1117/12.766182; https://doi.org/10.1117/12.766182
PROCEEDINGS
9 PAGES


SHARE
KEYWORDS
Sensors

Defect detection

Edge detection

Manufacturing

Image filtering

Detection and tracking algorithms

Image processing

Back to Top