Online non-contact detection for LED chips

Ping Li; Lian Li; Jing Wen; Yumei Wen

doi:10.1117/12.760235

20 November 2007 Online non-contact detection for LED chips

Ping Li, Lian Li, Jing Wen, Yumei Wen

Proceedings Volume 6828, Light-Emitting Diode Materials and Devices II; 68280X (2007) https://doi.org/10.1117/12.760235
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

An online non-contact fault detection technique of LED chips is presented based on the photovoltaic effect in diodes. By observing the current in the bonding lead frame of a LED chip, which is induced by illuminating the chip, the LED chip and its electric connection with the lead frame during packaging are checked. The fault detection principle is described in detail in this paper. Red, yellow and green LED chips are tested in the experiment. The experimental results show that the method can be easily realized, and thus can be used for online fault detection of LED chips in packaging.

Citation Download Citation

Ping Li, Lian Li, Jing Wen, and Yumei Wen "Online non-contact detection for LED chips", Proc. SPIE 6828, Light-Emitting Diode Materials and Devices II, 68280X (20 November 2007); https://doi.org/10.1117/12.760235

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