4 January 2008 Beam deflection measurement using Moire deflectometry and Talbot interferometry
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Abstract
This paper introduces a new and simple concept of moire effect. A circular grating placed at Talbot planes can achieve beam deflection measurement in real time. It is not only used for 2-D beam shift measurement at every point, but also used to measure the angle and plane parallel degree of optical element and birefringence measurement of the optical material.
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Z. Y. Chen, Z. Y. Chen, S. H. Leung, S. H. Leung, P. S. Chung, P. S. Chung, } "Beam deflection measurement using Moire deflectometry and Talbot interferometry", Proc. SPIE 6832, Holography and Diffractive Optics III, 68321A (4 January 2008); doi: 10.1117/12.758176; https://doi.org/10.1117/12.758176
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