Paper
28 November 2007 Specular surface measurement by using a moving diffusive structured light source
Hongwei Guo, Tao Tao
Author Affiliations +
Abstract
This paper presents a novel technique for measuring the three-dimensional shapes of specular surfaces. Differing from the conventional techniques, the diffusive light source in our technique can be moved vertically to two different positions, and at each position the phase distribution of the deformed fringe pattern is measured, so that the orientation of incident light for each pixel is tracked through the corresponding phases. The 3-D coordinates of points on the specular surface are further determined. In so doing, the restrictions and limitations of the existing techniques in computational complexities, phase ambiguities and error accumulations are eliminated. The validity of this technique is demonstrated by experimental results.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hongwei Guo and Tao Tao "Specular surface measurement by using a moving diffusive structured light source", Proc. SPIE 6834, Optical Design and Testing III, 68343E (28 November 2007); https://doi.org/10.1117/12.757576
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
LCDs

Fringe analysis

Silicon

Structured light

Light sources

Phase measurement

Phase shifts

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