Growth and characterization of <110> oriented ZnTe single crystal

Reng Wang; Weizheng Fang; Pei Zhao; Caihong Zhang; Lei Zhang; Jin Ge; Huier Zhang; Jun Shao; Shuhong Hu; Xuemin Shen; Ning Dai

doi:10.1117/12.754091

17 January 2008 Growth and characterization of <110> oriented ZnTe single crystal

Reng Wang, Weizheng Fang, Pei Zhao, Caihong Zhang, Lei Zhang, Jin Ge, Huier Zhang, Jun Shao, Shuhong Hu, Xuemin Shen, Ning Dai

Author Affiliations +

Proceedings Volume 6835, Infrared Materials, Devices, and Applications; 683519 (2008) https://doi.org/10.1117/12.754091
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

ZnTe crystal has been grown at a temperature as low as 1060°C using Te solvent method. X-ray diffraction showed that the ZnTe crystals were grown from <110> oriented. The transmission was over 60% from 2 μm to 22 μm by using Fourier Transform Infrared Spectrometer. The etch pit density in the sliced wafer was about 2×10⁴ cm^-2 detected by Scan Electronic Microscopic. The transmission spectrums were measured from 0.2 to 3 THz by using Terahertz Time Domain Spectroscopy. And the refractive index and extinction coefficient were obtained through analysis of the time domain waveform.

Citation Download Citation

Reng Wang, Weizheng Fang, Pei Zhao, Caihong Zhang, Lei Zhang, Jin Ge, Huier Zhang, Jun Shao, Shuhong Hu, Xuemin Shen, and Ning Dai "Growth and characterization of <110> oriented ZnTe single crystal", Proc. SPIE 6835, Infrared Materials, Devices, and Applications, 683519 (17 January 2008); https://doi.org/10.1117/12.754091

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