5 February 2008 Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses
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Abstract
In this paper, we presents the characterization technique of high-speed optoelectronics devices based electrical and optical spectra, which is as important access to the devices performance as the prevalent vector network analyzer (VNA) sweeping method. The measurement of additional modulation of laser and frequency response of photodetector from electrical spectra, and the estimation of the modulation indexes and the chirp parameters of directly modulated lasers based on optical spectra analysis, are given as examples.
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Ji Min Wen, Ji Min Wen, Tao Zhang, Tao Zhang, } "Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses", Proc. SPIE 6838, Optoelectronic Devices and Integration II, 68380Q (5 February 2008); doi: 10.1117/12.757336; https://doi.org/10.1117/12.757336
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