Confocal scanning microscopy with multiple optical probes for high speed measurements and better imaging

Wanhee Chun; SeungWoo Lee; Dae-Gab Gweon

doi:10.1117/12.763253

12 February 2008 Confocal scanning microscopy with multiple optical probes for high speed measurements and better imaging

Wanhee Chun, SeungWoo Lee, Dae-Gab Gweon

Author Affiliations +

Proceedings Volume 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV; 686115 (2008) https://doi.org/10.1117/12.763253
Event: SPIE BiOS, 2008, San Jose, California, United States

Abstract

Confocal scanning microscopy (CSM) needs a scanning mechanism because only one point information of specimen can be obtained. Therefore the speed of the confocal scanning microscopy is limited by the speed of the scanning tool. To overcome this limitation from scanning tool we propose another scanning mechanism. We make three optical probes in the specimen under confocal condition of each point. Three optical probes are moved by beam scanning mechanism with shared resonant scanning mirror (RM) and galvanometer driven mirror (GM). As each optical probe scan allocated region of the specimen, information from three points is obtained simultaneously and image acquisition time is reduced. Therefore confocal scanning microscopy with multiple optical probes is expected to have three times faster speed of the image acquisition than conventional one. And as another use, multiple optical probes to which different light wavelength is applied can scan whole same region respectively. It helps to obtain better contrast image in case of specimens having different optical characteristics for specific light wavelength. In conclusion confocal scanning microscopy with multiple optical probes is useful technique for views of image acquisition speed and image quality.

Citation Download Citation

Wanhee Chun, SeungWoo Lee, and Dae-Gab Gweon "Confocal scanning microscopy with multiple optical probes for high speed measurements and better imaging", Proc. SPIE 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 686115 (12 February 2008); https://doi.org/10.1117/12.763253

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