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21 February 2008 Turbid-polyurethane phantom for microscopy
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Abstract
Calibration standards are needed for measurements of tissues in reflectance mode confocal microscopy. We have created a three dimensional turbid polyurethane phantom with a grid of inclusions. The grid had a 10 fold increase in absorption compared to the bulk of the phantom and the same scattering properties. India ink was used as an absorber for the bulk of the phantom, and Epolin 5532 (absorption peak at 500 nm) was used in the grid. Titanium dioxide particles were used as scatterers. The optical properties of the constructed phantoms were characterized with difiuse reflectance and transmission measurements followed by an inverse adding doubling method. At 488nm the total attenuation coeffcient was 40.6 ± 0.3 cm-1 in the grid and 32.5 ± 0.3 cm-1 in the bulk of the phantom. The phantom was imaged with reflectance mode confocal microscopy. Image analysis using the Beer-Lambert-Bouguer Law was performed. In the low absorbing bulk of the phantom the total attenuation coeffcient was estimated accurately, however in the high absorbing grid, the total attenuation coeffcient was underestimated by image analysis techniques.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. L. Dayton and S. A., Prahl "Turbid-polyurethane phantom for microscopy", Proc. SPIE 6870, Design and Performance Validation of Phantoms Used in Conjunction with Optical Measurements of Tissue, 687006 (21 February 2008); https://doi.org/10.1117/12.764010
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