13 February 2008 Measurement of the nonlinear optical properties of semiconductors using the irradiance scan technique
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Abstract
Irradiance scan measurements of the nonlinear absorption and refraction coefficients of CdTe were performed at room temperature and at 77 K and compared to the values obtained in previous experiments using a different technique.
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Leonel P. Gonzalez, Leonel P. Gonzalez, Joel M. Murray, Joel M. Murray, Vincent M. Cowan, Vincent M. Cowan, Shekhar Guha, Shekhar Guha, } "Measurement of the nonlinear optical properties of semiconductors using the irradiance scan technique", Proc. SPIE 6875, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VII, 68750R (13 February 2008); doi: 10.1117/12.763152; https://doi.org/10.1117/12.763152
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