Measuring mass flows in hermetically sealed MEMS and MOEMS to ensure device reliability

R. C. Kullberg; D. J. Rossiter

doi:10.1117/12.760823

20 February 2008 Measuring mass flows in hermetically sealed MEMS and MOEMS to ensure device reliability

R. C. Kullberg, D. J. Rossiter

Proceedings Volume 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII; 68840L (2008) https://doi.org/10.1117/12.760823
Event: MOEMS-MEMS 2008 Micro and Nanofabrication, 2008, San Jose, California, United States

Abstract

Many MEMs and MOEMs devices require controlled ambient environments for successful operation. Controlled ambients are usually obtained via hermetic packaging. These controlled environments must first be obtained and then maintained to prevent their degradation over the device lifetime. Controlled ambients decay in quality over time due to various mechanisms including leaks, permeation, poor processing and outgassing of species like hydrogen, water and organics external and internal to the package. The key to controlling the process of degradation is to understand in a quantitative manner which species are present and their mass flow rates into the controlled ambient. The current work describes a new technique for determining these species and mass flow rates. This new technology provides tremendous sensitivity to package volumes < 0.01cc compared to standard quadrupole techniques, which are applicable to samples larger than 0.01 cc. The technology is based on a high speed, high mass resolution, and highly sensitive Time-Of-Flight (TOF) spectrometer to test the tiniest of devices with significant advancement in signal-to-noise ratios. Key operational parameters demonstrated include: - Spectra Acquisition speed: 1 full spectra every 20 μs. - Mass Range: mass 2 to 150 standard (2-500 capable) - Mass resolution: 0.1 AMU - Calibration Fixtures: 0.0001, 0.0005, 0.001, 0.005 and 0.01 cc - Sample temperature: 100°C standard (room temperature to 150°C capable).

Citation Download Citation

R. C. Kullberg and D. J. Rossiter "Measuring mass flows in hermetically sealed MEMS and MOEMS to ensure device reliability", Proc. SPIE 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII, 68840L (20 February 2008); https://doi.org/10.1117/12.760823

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available