A High Intensity Line Source For X-Ray Spectrometer Calibration

R. S. Thoe

doi:10.1117/12.936558

12 August 1986 A High Intensity Line Source For X-Ray Spectrometer Calibration

R. S. Thoe

Proceedings Volume 0689, X-Ray Calibration: Techniques, Sources, and Detectors; (1986) https://doi.org/10.1117/12.936558
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

A high intensity electron-impact x-ray source using a one-dimensional Pierce lens has been built for the purpose of calibrating a bent crystal x-ray spectrometer. This source focuses up to 100 mA of 20-keV electrons to a line on a liquid-cooled anode. The line (which can serve as a virtual slit for the spectrometer) measures approximately 800 µ x 2 cm. The source is portable and therefore adaptable to numerous types of spectrometer applications. One particular application, the calibration of a high resolution (r = 104) time-resolved crystal spectrometer, will be discussed in detail.

Citation Download Citation

R. S. Thoe "A High Intensity Line Source For X-Ray Spectrometer Calibration", Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); https://doi.org/10.1117/12.936558

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