Performance of Oblique Angle of Incidence Collection Systems in the VUV

Geza L. Keller; Marion L. Scott; Kenneth Mitchell

doi:10.1117/12.936586

12 August 1986 Performance of Oblique Angle of Incidence Collection Systems in the VUV

Geza L. Keller, Marion L. Scott, Kenneth Mitchell

Proceedings Volume 0689, X-Ray Calibration: Techniques, Sources, and Detectors; (1986) https://doi.org/10.1117/12.936586
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

High rejection filters are difficult enough to achieve in the UV-VIS-IR with known materials and constants. Even more difficult is the design and manufacture of rejection filters in the EUV and VUV given the uncertainty of optical constants and their wide variation over this spectral range. We have begun work to characterize materials from 584 Å to 1,300 Å to verify reported optical constants, in order to design and realize the optimum collection system.

Citation Download Citation

Geza L. Keller, Marion L. Scott, and Kenneth Mitchell "Performance of Oblique Angle of Incidence Collection Systems in the VUV", Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); https://doi.org/10.1117/12.936586

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