Accurate Measurement of Normal Spectral Emittance by Using FT-IR Spectrometer

S. Tanemura; M. Sando; A. Fujii; S. Nishizawa; M. Kawasaki

doi:10.1117/12.936701

23 February 1987 Accurate Measurement of Normal Spectral Emittance by Using FT-IR Spectrometer

S. Tanemura, M. Sando, A. Fujii, S. Nishizawa, M. Kawasaki

Proceedings Volume 0692, Materials and Optics for Solar Energy Conversion and Advanced Lightning Technology; (1987) https://doi.org/10.1117/12.936701
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

By using the emittance meter based on rapid-scan FT-IR spectrometer and the thermo visualized apparatus for the determination of the sample surface temperature and the black body temperature, the accuracy of normal spectral emittance (NSE) was significantly improved. For an example, the accuracy of NSE of the sintered Si3N4 ceramics at about 483°C was assured to be better than ±2% in emittance unit between 3,950 and 400 cm-1 in wave-numbers, while that of measured NSE of the sintered β-SiC ceramics at about 82°C being assured again to be better than ±2% in emittance unit between 2,500 and 400 cm-1 in wave-numbers.

Citation Download Citation

S. Tanemura, M. Sando, A. Fujii, S. Nishizawa, and M. Kawasaki "Accurate Measurement of Normal Spectral Emittance by Using FT-IR Spectrometer", Proc. SPIE 0692, Materials and Optics for Solar Energy Conversion and Advanced Lightning Technology, (23 February 1987); https://doi.org/10.1117/12.936701

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