28 March 2008 Film quantum yields of EUV and ultra-high PAG photoresists
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Abstract
Base titration methods are used to determine C-parameters for three industrial EUV photoresist platforms (EUV- 2D, MET-2D, XP5496) and twenty academic EUV photoresist platforms. X-ray reflectometry is used to measure the density of these resists, and leads to the determination of absorbance and film quantum yields (FQY). Ultrahigh levels of PAG show divergent mechanisms for production of photoacids beyond PAG concentrations of 0.35 moles/liter. The FQY of sulfonium PAGs level off, whereas resists prepared with iodonium PAG show FQYs that increase beyond PAG concentrations of 0.35 moles/liter, reaching record highs of 8-13 acids generated/EUV photons absorbed.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elsayed Hassanein, Elsayed Hassanein, Craig Higgins, Craig Higgins, Patrick Naulleau, Patrick Naulleau, Richard Matyi, Richard Matyi, Gregg Gallatin, Gregg Gallatin, Gregory Denbeaux, Gregory Denbeaux, Alin Antohe, Alin Antohe, Jim Thackeray, Jim Thackeray, Kathleen Spear, Kathleen Spear, Charles Szmanda, Charles Szmanda, Christopher N. Anderson, Christopher N. Anderson, Dimitra Niakoula, Dimitra Niakoula, Matthew Malloy, Matthew Malloy, Anwar Khurshid, Anwar Khurshid, Cecilia Montgomery, Cecilia Montgomery, Emil C. Piscani, Emil C. Piscani, Andrew Rudack, Andrew Rudack, Jeff Byers, Jeff Byers, Andy Ma, Andy Ma, Kim Dean, Kim Dean, Robert Brainard, Robert Brainard, } "Film quantum yields of EUV and ultra-high PAG photoresists", Proc. SPIE 6921, Emerging Lithographic Technologies XII, 69211I (28 March 2008); doi: 10.1117/12.774099; https://doi.org/10.1117/12.774099
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