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28 December 2007Application of local cluster neural network to detect structure analysis of semi-insulating GaAs
This paper prsents a method of detection of deep defect centres in semi-insulating materials, with usage of neural net
application. Innovation of this work is based on implementation of local cluster activation function in standard scheme
of neural network.
Stanisław Jankowski andTomasz Piotr Pichlak
"Application of local cluster neural network to detect structure analysis of semi-insulating GaAs", Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371V (28 December 2007); https://doi.org/10.1117/12.784708
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Stanisław Jankowski, Tomasz Piotr Pichlak, "Application of local cluster neural network to detect structure analysis of semi-insulating GaAs," Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371V (28 December 2007); https://doi.org/10.1117/12.784708