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28 December 2007 Application of local cluster neural network to detect structure analysis of semi-insulating GaAs
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Proceedings Volume 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007; 69371V (2007) https://doi.org/10.1117/12.784708
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 2007, Wilga, Poland
Abstract
This paper prsents a method of detection of deep defect centres in semi-insulating materials, with usage of neural net application. Innovation of this work is based on implementation of local cluster activation function in standard scheme of neural network.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stanisław Jankowski and Tomasz Piotr Pichlak "Application of local cluster neural network to detect structure analysis of semi-insulating GaAs", Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371V (28 December 2007); https://doi.org/10.1117/12.784708
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