Application of local cluster neural network to detect structure analysis of semi-insulating GaAs

Stanisław Jankowski; Tomasz Piotr Pichlak

doi:10.1117/12.784708

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28 December 2007 Application of local cluster neural network to detect structure analysis of semi-insulating GaAs

Stanisław Jankowski, Tomasz Piotr Pichlak

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Proceedings Volume 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007; 69371V (2007) https://doi.org/10.1117/12.784708
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 2007, Wilga, Poland

Abstract

This paper prsents a method of detection of deep defect centres in semi-insulating materials, with usage of neural net application. Innovation of this work is based on implementation of local cluster activation function in standard scheme of neural network.

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Stanisław Jankowski and Tomasz Piotr Pichlak "Application of local cluster neural network to detect structure analysis of semi-insulating GaAs", Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371V (28 December 2007); https://doi.org/10.1117/12.784708

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