17 March 2008 Active thermography for potato characterization
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Proceedings Volume 6939, Thermosense XXX; 69390P (2008); doi: 10.1117/12.778137
Event: SPIE Defense and Security Symposium, 2008, Orlando, Florida, United States
Abstract
This paper describes the design of a semi-automated heating and scanning system and analytic method for potato characterization. Potatoes are heated using lamps in a heating chamber and then transferred on a movable fixture to an imaging chamber. A non-linear model was designed to predict which potatoes have excessive sugar defects and the model was evaluated with good results. Results from this research will benefit potato growers and manufacturers/producers of potato-based products such as chips and fries.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sheng-Jen Hsieh, Chih-Chen Sun, "Active thermography for potato characterization", Proc. SPIE 6939, Thermosense XXX, 69390P (17 March 2008); doi: 10.1117/12.778137; https://doi.org/10.1117/12.778137
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KEYWORDS
Thermography

Inspection

Thermal modeling

Data modeling

Image processing

Analytical research

Food inspection

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