Polarization measurements made on LFRA and OASIS emitter arrays

Jon Geske; Kevin Sparkman; Jim Oleson; Joe Laveigne; Breck Sieglinger; Steve Marlow; Heard Lowry; James Burns

doi:10.1117/12.796421

24 April 2008 Polarization measurements made on LFRA and OASIS emitter arrays

Jon Geske, Kevin Sparkman, Jim Oleson, Joe Laveigne, Breck Sieglinger, Steve Marlow, Heard Lowry, James Burns

Proceedings Volume 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII; 69420L (2008) https://doi.org/10.1117/12.796421
Event: SPIE Defense and Security Symposium, 2008, Orlando, Florida, United States

Abstract

Polarization is increasingly being considered as a method of discrimination in passive sensing applications. In this paper the degree of polarization of the thermal emission from the emitter arrays of two new Santa Barbara Infrared (SBIR) micro-bolometer resistor array scene projectors was characterized at ambient temperature and at 77 K. The emitter arrays characterized were from the Large Format Resistive Array (LFRA) and the Optimized Arrays for Space-Background Infrared Simulation (OASIS) scene projectors. This paper reports the results of this testing.

Citation Download Citation

Jon Geske, Kevin Sparkman, Jim Oleson, Joe Laveigne, Breck Sieglinger, Steve Marlow, Heard Lowry, and James Burns "Polarization measurements made on LFRA and OASIS emitter arrays", Proc. SPIE 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII, 69420L (24 April 2008); https://doi.org/10.1117/12.796421

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