30 April 2008 Effect of nitrogen gas on the lifetime of carbon nanotube field emitters for electron-impact ionization mass spectrometry
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Abstract
The lifetime of a patterned carbon nanotube film is evaluated for use as the cold cathode field emission ionization source of a miniaturized mass spectrometer. Emitted current is measured as a function of time for varying partial pressures of nitrogen gas to explore the robustness and lifetime of carbon nanotube cathodes near the expected operational voltages (70-100 eV) for efficient ionization in mass spectrometry. As expected, cathode lifetime scales inversely with partial pressure of nitrogen. Results are presented within the context of previous carbon nanotube investigations, and implications for planetary science mass spectrometry applications are discussed.
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Stephanie A. Getty, Rachael A. Bis, Stacy Snyder, Emily Gehrels, Kristina Ramirez, Todd T. King, Patrick A. Roman, Paul R. Mahaffy, "Effect of nitrogen gas on the lifetime of carbon nanotube field emitters for electron-impact ionization mass spectrometry", Proc. SPIE 6959, Micro (MEMS) and Nanotechnologies for Space, Defense, and Security II, 695907 (30 April 2008); doi: 10.1117/12.776914; https://doi.org/10.1117/12.776914
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