Automated detection of EOS-ESD in electronic circuits using a polarization modulation sensing system

Niels Jacksen; James Karins; Tom Odom; Steve Hampton; John Slawenski; Randy Cox; William Robinson

doi:10.1117/12.777828

2 April 2008 Automated detection of EOS-ESD in electronic circuits using a polarization modulation sensing system

Niels Jacksen, James Karins, Tom Odom, Steve Hampton, John Slawenski, Randy Cox, William Robinson

Proceedings Volume 6972, Polarization: Measurement, Analysis, and Remote Sensing VIII; 697207 (2008) https://doi.org/10.1117/12.777828
Event: SPIE Defense and Security Symposium, 2008, Orlando, Florida, United States

Abstract

A new detection system has been designed and constructed that enables remote sensing, recording and archiving of Electrical Over-Stress (EOS) and Electro Static Discharge (ESD) events, a major cause of electronic device failure in ruggedized military applications. Advances have been made in the design and manufacture of magneto-optic static event detection devices and in the ability to perform automatic detection of polarization states of the devices. The combined automatic reader and next-generation device are providing viable prototypes for insertion into legacy circuit boards for EOS and ESD monitoring.

Citation Download Citation

Niels Jacksen, James Karins, Tom Odom, Steve Hampton, John Slawenski, Randy Cox, and William Robinson "Automated detection of EOS-ESD in electronic circuits using a polarization modulation sensing system", Proc. SPIE 6972, Polarization: Measurement, Analysis, and Remote Sensing VIII, 697207 (2 April 2008); https://doi.org/10.1117/12.777828

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