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2 April 2008 Automated detection of EOS-ESD in electronic circuits using a polarization modulation sensing system
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Abstract
A new detection system has been designed and constructed that enables remote sensing, recording and archiving of Electrical Over-Stress (EOS) and Electro Static Discharge (ESD) events, a major cause of electronic device failure in ruggedized military applications. Advances have been made in the design and manufacture of magneto-optic static event detection devices and in the ability to perform automatic detection of polarization states of the devices. The combined automatic reader and next-generation device are providing viable prototypes for insertion into legacy circuit boards for EOS and ESD monitoring.
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Niels Jacksen, James Karins, Tom Odom, Steve Hampton, John Slawenski, Randy Cox, and William Robinson "Automated detection of EOS-ESD in electronic circuits using a polarization modulation sensing system", Proc. SPIE 6972, Polarization: Measurement, Analysis, and Remote Sensing VIII, 697207 (2 April 2008); https://doi.org/10.1117/12.777828
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