Paper
17 March 2008 A new approach to chemical agent detection, classification, and estimation
Tao Qian, Genshe Chen, Erik Blasch, Robert Lynch, Yongwei Qi
Author Affiliations +
Abstract
Chemical and biological agent detection has gained a great deal of interest in various applications. We present a new approach to vapor classification and concentration estimation in spacecraft environment. The approach consists of two steps. First, a classifier based on a Support Vector Machine (SVM) is used to identify the presence of toxic vapors. Second, once the vapors are classified, a cubic spline fitting and linear additive model for mixtures based concentration estimation algorithm is used to estimate the concentration of vapor. Once trained, the estimation algorithm can accurately estimate vapor concentrations for both single and mixture vapors under different humidity conditions. Extensive performance evaluations were performed by using e-nose data collected at NASA KCS. We achieved more than 99% accuracy for single vapors and 98% for binary mixture vapors. The classification success rate was 87% using the linear discriminant method. Comparative studies were conducted between the SVM classifier and other classifiers such as Probability Neural Network (PNN) and Learning Vector Quantization (LVQ). In all cases, the SVM classifier showed superior performance over other classifiers. In the concentration estimation part, we achieved less than 3% error in single vapor cases and less than 10% error in mixture cases.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tao Qian, Genshe Chen, Erik Blasch, Robert Lynch, and Yongwei Qi "A new approach to chemical agent detection, classification, and estimation", Proc. SPIE 6973, Data Mining, Intrusion Detection, Information Assurance, and Data Networks Security 2008, 69730K (17 March 2008); https://doi.org/10.1117/12.778501
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Error analysis

Statistical analysis

Chemical analysis

Humidity

Nose

Resistance

Back to Top