11 March 2008 The effect of sol concentration on 0.6BiFeO3-0.4PbTiO3 thin films prepared by sol-gel method
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Proceedings Volume 6984, Sixth International Conference on Thin Film Physics and Applications; 69840T (2008) https://doi.org/10.1117/12.792358
Event: Sixth International Conference on Thin Film Physics and Applications, 2007, Shanghai, China
Abstract
A series of 0.6BiFeO3-0.4PbTiO3 (BFO-PT) thin films were fabricated by sol-gel technique with sol concentrations varying from 0.2M to 0.4M. X-ray diffraction (XRD) and scanning electron microscope (SEM) were utilized to characterize the structure and morphology of the BFO-PT films. The crystallinity of the films is improved with increasing the BFO-PT sol concentration. The dielectric properties and leakage current density of BFO-PT films were measured. The dielectric constants of all films are reasonably stable and the dielectric losses are below 5%. Considerably lower leakage current density is obtained in our sol-gel films.
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Jinyu Cai, Jinyu Cai, Shengwen Yu, Shengwen Yu, Jinrong Cheng, Jinrong Cheng, Ya Lu, Ya Lu, Zhongyan Meng, Zhongyan Meng, } "The effect of sol concentration on 0.6BiFeO3-0.4PbTiO3 thin films prepared by sol-gel method", Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 69840T (11 March 2008); doi: 10.1117/12.792358; https://doi.org/10.1117/12.792358
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