Enhanced energy throughput in corrugated tapered metal-coated SNOM probes

T. J. Antosiewicz; T. Szoplik

doi:10.1117/12.785223

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6 May 2008 Enhanced energy throughput in corrugated tapered metal-coated SNOM probes

T. J. Antosiewicz, T. Szoplik

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Proceedings Volume 6987, Metamaterials III; 698705 (2008) https://doi.org/10.1117/12.785223
Event: SPIE Photonics Europe, 2008, Strasbourg, France

Abstract

Interest in optical devices that image with superresolution and inherent optical parallelism continues. Recently, the concept of superresolution is pursued along the lines of negative refraction and transparent multilayer, metallo-dielectric photonic band gap structures. Flat superlenses image from the near-field to the near- or far-field with resolution beyond the diffraction limit. There is a need for characterization methods which allow measurement of the point spread function of such devices. Scanning near-field microscopes (SNOMs) measure the field intensity in the vicinity of objects as close as 5 nm due to shear-force technique. Improvement of transversal resolution up to λ/20 may be possible due to considerable improvement of energy throughput of SNOM probes. To this aim we propose to corrugate the dielectric core-metal coating interface of SNOM probes. The corrugations facilitate the excitation of surface plasmons, which enhance the transport of energy to the probe aperture.

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T. J. Antosiewicz and T. Szoplik "Enhanced energy throughput in corrugated tapered metal-coated SNOM probes", Proc. SPIE 6987, Metamaterials III, 698705 (6 May 2008); https://doi.org/10.1117/12.785223

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