6 May 2008 Double-negative metamaterial optical waveguide behavior subjected to stress
Author Affiliations +
Abstract
Stress effect on the behavior of optical waveguide sensor consists of dielectric slab inserted between metamaterial (MTM) cladding and substrate is investigated by using numerical calculations. Several MTMs with different values of ε and μ with ε μ = 4 are chosen in order to clarify the variation of stress effect with respect to the material constants. Numerical calculations of the effective index for both transverse electric modes (TE) and transverse magnetic modes (TM) as a function of stress and slab thickness have been performed. It is found that stress affects the performance of the waveguide sensor.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. J. El-Khozondar, R. J. El-Khozondar, M. M. Shabat, "Double-negative metamaterial optical waveguide behavior subjected to stress", Proc. SPIE 6987, Metamaterials III, 69871W (6 May 2008); doi: 10.1117/12.780734; https://doi.org/10.1117/12.780734
PROCEEDINGS
8 PAGES


SHARE
Back to Top