Optical characterization of periodically poled KTP

W. H. Peeters; M. P. van Exter

doi:10.1117/12.780592

23 April 2008 Optical characterization of periodically poled KTP

W. H. Peeters, M. P. van Exter

Proceedings Volume 6988, Nanophotonics II; 69880E (2008) https://doi.org/10.1117/12.780592
Event: SPIE Photonics Europe, 2008, Strasbourg, France

Abstract

We demonstrate and compare three different experimental techniques to characterize the quality of periodically poled crystals. All techniques are based on the observation and analysis of Maker fringes in either spontaneous parametric down-conversion (SPDC) or second harmonic generation (SHG). For perfectly-poled crystals these Maker fringes are expected to have a sinc²-shape. We show how the observed deviations from this ideal shape can be used to characterize the quality of the poling structure and analyze them with a new Fourier method, which distinguished between variations in the poling composition and poling period.

Citation Download Citation

W. H. Peeters and M. P. van Exter "Optical characterization of periodically poled KTP", Proc. SPIE 6988, Nanophotonics II, 69880E (23 April 2008); https://doi.org/10.1117/12.780592

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