8 May 2008 Diffractive optical element for improving the Z-scan technique sensitivity
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Proceedings Volume 6994, Photon Management III; 69940I (2008); doi: 10.1117/12.780266
Event: SPIE Photonics Europe, 2008, Strasbourg, France
Abstract
One of the most successful experimental technique for determining nonlinear properties of optical materials is the Z-scan technique. Interaction between a high intensity beam with a Kerr medium gives rise to a lensing effect that implies focusing or defocusing of the beam which is transformed into transmittance variations of a diaphragm set in the far-field. In other words, one can consider Z-scan technique as a diagnostic of beam divergence variations and its ultimate sensitivity depends on the smallest transmittance change that can be measured. In this paper we propose a new technique allowing to multiply the sensitivity of the Z-scan technique by a factor greater than one hundred. The basic idea is to "amplify" the divergence variation, by a Diffractive Optical Element.
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R. de Saint Denis, M. Fromager, E. Cagniot, K. Ait-Ameur, "Diffractive optical element for improving the Z-scan technique sensitivity", Proc. SPIE 6994, Photon Management III, 69940I (8 May 2008); doi: 10.1117/12.780266; https://doi.org/10.1117/12.780266
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KEYWORDS
Transmittance

Gaussian beams

Diffractive optical elements

Phase shifts

Diagnostics

Refraction

Nonlinear optics

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