Flaw detection and segmentation in textile inspection

María S. Millán; Miquel Ralló; Jaume Escofet

doi:10.1117/12.786528

25 April 2008 Flaw detection and segmentation in textile inspection

María S. Millán, Miquel Ralló, Jaume Escofet

Proceedings Volume 7000, Optical and Digital Image Processing; 70000A (2008) https://doi.org/10.1117/12.786528
Event: SPIE Photonics Europe, 2008, Strasbourg, France

Abstract

We present a new method to automatically segment local defects in a woven fabric that does not require any additional defect-free reference for comparison. Firstly, the structural features of the repetition pattern of the minimal weave repeat are extracted from the Fourier spectrum of the sample under inspection. The corresponding peaks are automatically identified and removed from the fabric frequency spectrum. Secondly, we define a set of multi-scale oriented bandpass filters, adapted to the specific structure of the sample, that operate in the Fourier domain. The filter design is the key part of the method. Using the set of filters, local defects can be extracted. Thirdly, the filtered images obtained at different scales are inverse Fourier transformed, binarized and merged to obtain an output image where flaws are segmented from the fabric background. The method can be applied to fabrics of uniform color as well as to fabrics woven with threads of different colors. It is Euclidean motion invariant and texture adaptive and it is useful for automatic inspection both online and off-line. The whole process is fully automatic and can be implemented either optical or electronically. A variety of experimental results are presented and discussed.

Citation Download Citation

María S. Millán, Miquel Ralló, and Jaume Escofet "Flaw detection and segmentation in textile inspection", Proc. SPIE 7000, Optical and Digital Image Processing, 70000A (25 April 2008); https://doi.org/10.1117/12.786528

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
11 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Image filtering

Inspection

Image segmentation

Bandpass filters

Feature extraction

Spatial filters

Fourier transforms

Show All Keywords

Keywords/Phrases

Search In:

Publication Years