5 May 2008 The optical near-field of randomly textured light trapping structures for thin-film solar cells
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Proceedings Volume 7002, Photonics for Solar Energy Systems II; 70020D (2008); doi: 10.1117/12.781121
Event: SPIE Photonics Europe, 2008, Strasbourg, France
Abstract
Randomly textured zinc oxide surfaces with and without amorphous silicon deposited on top are studied by near-field scanning optical microscopy. By virtue of a three dimensions it allows to access the local light intensity in the entire spatial domain above the structures. Measurements are compared with large scale finite-difference time-domain simulations. This study provides new insight into light trapping in thin-film silicon solar cells on a nanoscopic scale. Light localization on the surface of the textured interface and a focusing of light by the structure further away are observed as the key features characteristic for such surfaces.
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T. Beckers, K. Bittkau, C. Rockstuhl, S. Fahr, F. Lederer, R. Carius, "The optical near-field of randomly textured light trapping structures for thin-film solar cells", Proc. SPIE 7002, Photonics for Solar Energy Systems II, 70020D (5 May 2008); doi: 10.1117/12.781121; https://doi.org/10.1117/12.781121
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KEYWORDS
Zinc oxide

Amorphous silicon

Near field scanning optical microscopy

Near field optics

Thin film solar cells

Near field

Finite-difference time-domain method

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