28 April 2008 Efficient processing technique based on plasma optical spectroscopy for on-line welding quality monitoring
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Abstract
In this paper a new spectroscopic analysis technique is proposed for on-line welding quality monitoring. This approach is based on the estimation of the wavelength associated with the maximum intensity of the background signal (continuum) of the welding plasma spectra. It will be demonstrated that this parameter exhibits a clear correlation with the welding quality of the seams, as it also happens with the traditional spectroscopic approach based on the determination of the plasma electronic temperature, thus allowing an identification of the appearance of weld defects. This technique offers a relevant improvement in terms of computational performance, what enables to detect smaller defects within the seam.
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J. Mirapeix, J. Mirapeix, A. Cobo, A. Cobo, A. M. Cubillas, A. M. Cubillas, O. M. Conde, O. M. Conde, J. M. Lopez-Higuera, J. M. Lopez-Higuera, } "Efficient processing technique based on plasma optical spectroscopy for on-line welding quality monitoring", Proc. SPIE 7003, Optical Sensors 2008, 70030Q (28 April 2008); doi: 10.1117/12.781055; https://doi.org/10.1117/12.781055
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