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16 May 2008 Optical fiber temperature sensor using a thin film band pass filter and dual wavelength push-pull reflectometry
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Proceedings Volume 7004, 19th International Conference on Optical Fibre Sensors; 70041D (2008) https://doi.org/10.1117/12.785739
Event: 19th International Conference on Optical Fibre Sensors, 2008, Perth, WA, Australia
Abstract
This experimental temperature sensing system uses dual wavelength push-pull reflectometry and a thin-film band pass filter deposited on an optical fiber end face. The system presents advantages over fiber Bragg grating sensors: it can use the mature optical time domain reflectometry (OTDR) technology instead of expensive wavelength-selective technology; it can probe the temperature in a small spot area; and it can be free from influences of disturbances along the optical fiber or within the measuring system. Moreover, it preserves merits of optical fibers such as low transmission loss and immunity to electromagnetic noise. The presented system has measurement accuracy of better than ±0.5°C.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yasutoshi Komatsu, Keiichi Inoue, Masayuki Nakano, and Seiichi Onoda "Optical fiber temperature sensor using a thin film band pass filter and dual wavelength push-pull reflectometry", Proc. SPIE 7004, 19th International Conference on Optical Fibre Sensors, 70041D (16 May 2008); https://doi.org/10.1117/12.785739
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