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29 April 2008 Optical differential evanesent investigation of nanometric dielectric materials morphology on waveguides
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Proceedings Volume 7007, INDLAS 2007: Industrial Laser Applications; 700708 (2008) https://doi.org/10.1117/12.801932
Event: INDLAS 2007: Industrial Laser Applications, 2007, Bran, Romania
Abstract
In this work, nanometer thickness dielectric layers deposited from colloid solutions using irradiation with Short Wavelength (SW) in the visible domain have been investigated by the Differential Evanescent Light Intensity (DELI) method. A high intensity UV filtered irradiation lamp was used for photodepositing nano-layers, directly on glass substrates serving as waveguides. The amorphous Selenium (a-Se) nanometric thin layers were deposited as circular zones of about ~ 1 cm2 area. Polypropylene and Polyethylene compounds melted on glass waveguides were also analyzed by DELI.
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Simona Popescu, Nina Mirchin, Igor Lapsker, Petru V. Notingher, Ion Mihailescu, and Aaron Peled "Optical differential evanesent investigation of nanometric dielectric materials morphology on waveguides", Proc. SPIE 7007, INDLAS 2007: Industrial Laser Applications, 700708 (29 April 2008); https://doi.org/10.1117/12.801932
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