22 April 2008 X-ray, gamma-ray detector/imager by CdTe semiconductor and its applications
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Proceedings Volume 7008, Eighth International Conference on Correlation Optics; 70080R (2008) https://doi.org/10.1117/12.796991
Event: Eighth International Conference on Correlation Optics, 2007, Chernivsti, Ukraine
Abstract
Photon counting type X-ray, gamma-ray detector and imager were developed by using CdTe compound semiconductor. The detector / imager could be applied for practical application and we tried to apply material identificated X-ray CT. The imager has photon energy discriminate function and high linearity between number of incident photons and output counts. It make high contrast image for X-ray penetration image and material identification in X-ray computed tomography (CT) measurement.
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Toru Aoki, Hisashi Morii, Takuya Nakashima, Yasuyuki Takahashi, Gosuke Ohashi, Yasuhiro Tomita, Yoichiro Neo, Hidenori Mimura, "X-ray, gamma-ray detector/imager by CdTe semiconductor and its applications", Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70080R (22 April 2008); doi: 10.1117/12.796991; https://doi.org/10.1117/12.796991
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