5 March 2008 Characterization of new metallized polyimide films with high electrooptical performances
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Proceedings Volume 7009, Second International Conference on Advanced Optoelectronics and Lasers; 700914 (2008); doi: 10.1117/12.793449
Event: Second International Conference on Advanced Optoelectronics and Lasers, 2005, Yalta, Ukraine
Abstract
The specific properties and structure of new chemically metallized polyimides films were investigated by RSA, DSK, TGA methods and by measurements of the microhardness, reflectivity and the electrical conductivity. The surface layers represent composite material in which metal nanoparticles strengthen the polymer. The method of microhardness can be used as express-method for estimation the depth of metal particle penetration. The value of the electrical conductivity permits to estimate the thickness of "high conductivity" owing to impurities after chemical modification. The high adhesion and reflection coefficient in visible spectrum part, caused by the specific structure, makes these films prospective for new technicues.
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Saule K. Kudaikulova, Rinat M. Iskakov, Irina V. Razumovskaja, Sergei L. Bazhenov, Vladimir N. Koptsev, Oleg Y. Prikhodko, Andrei P. Kurbatov, Tleuken Z. Akhmetov, Bulat A. Zhubanov, Marc J. M. Abadie, "Characterization of new metallized polyimide films with high electrooptical performances", Proc. SPIE 7009, Second International Conference on Advanced Optoelectronics and Lasers, 700914 (5 March 2008); doi: 10.1117/12.793449; https://doi.org/10.1117/12.793449
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KEYWORDS
Metals

Silver

Reflection

Optical coatings

Particles

Temperature metrology

Nickel

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