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10 July 1987 Remote Nondestructive Material Analysis By Photothermal Interferometry
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Proceedings Volume 0701, 1986 European Conf on Optics, Optical Systems and Applications; (1987) https://doi.org/10.1117/12.937064
Event: 1986 International European Conference on Optics, Optical Systems, and Applications, 1986, Florence, Italy
Abstract
Interferometry is used for the detection of thermal waves to study material properties. A symmetrical interferometer as thermal expansion detector was developed for photothermal nondestructive material analysis. After mixing a phase shifted reference signal electrically to the interferometer signal, phase and amplitude exchange phenomena have been observed.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Z. Sodnik and H. J. Tiziani "Remote Nondestructive Material Analysis By Photothermal Interferometry", Proc. SPIE 0701, 1986 European Conf on Optics, Optical Systems and Applications, (10 July 1987); doi: 10.1117/12.937064; https://doi.org/10.1117/12.937064
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