Paper
28 July 2008 The wide-field imaging interferometry testbed (WIIT): recent progress and results
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Abstract
Research with the Wide-Field Imaging Interferometry Testbed (WIIT) is ongoing, and in the past year we have achieved several important milestones. We have moved WIIT into the Advanced Interferometry and Metrology (AIM) Laboratory at Goddard, and have characterized the testbed in this well-controlled environment. The system is now completely automated and we are in the process of acquiring large data sets for analysis. In this paper, we discuss these new developments and outline our future research directions. The WIIT testbed, combined with new data analysis techniques and algorithms, provides a demonstration of the technique of wide-field interferometric imaging, a powerful tool for future space-borne interferometers. Algorithm development is discussed in a separate paper within this conference.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Rinehart, D. Leisawitz, B. Frey, R. Lyon, S. Maher, and N. Memarsadeghi "The wide-field imaging interferometry testbed (WIIT): recent progress and results", Proc. SPIE 7013, Optical and Infrared Interferometry, 70132S (28 July 2008); https://doi.org/10.1117/12.787402
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Cited by 5 scholarly publications and 1 patent.
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KEYWORDS
Interferometry

Interferometers

Data modeling

Data acquisition

Algorithm development

Mirrors

Metrology

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