Paper
2 May 2008 Metrological aspects of symmetric double frequency and multi frequency reflectometry for fiber Bragg structures
Oleg G. Morozov, Oleg G. Natanson, Dmitry L. Aybatov, Anvar A. Talipov, Vitalii P. Prosvirin, Alexei S. Smirnov
Author Affiliations +
Proceedings Volume 7026, Optical Technologies for Telecommunications 2007; 70260J (2008) https://doi.org/10.1117/12.801507
Event: Optical Technologies for Telecommunications 2007, 2007, Ufa, Russian Federation
Abstract
In paper metrological aspects of symmetric double frequency and multi frequency reflectometry for Bragg structures are considered. Basics of this method is amplitude phase conversion of coherent single frequency radiation to double frequency and its distinguished features are frequency-shifted spectral components symmetrical position relatively suppressed frequency of initial radiation, high level of spectral purity, stable output radiation, and high conversion ratio. In paper are considered the metrological aspects of following systems: a) symmetric multi frequency reflectometry system for Bragg structures control, and b) symmetric double frequency reflectometry system for Bragg structures.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oleg G. Morozov, Oleg G. Natanson, Dmitry L. Aybatov, Anvar A. Talipov, Vitalii P. Prosvirin, and Alexei S. Smirnov "Metrological aspects of symmetric double frequency and multi frequency reflectometry for fiber Bragg structures", Proc. SPIE 7026, Optical Technologies for Telecommunications 2007, 70260J (2 May 2008); https://doi.org/10.1117/12.801507
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Cited by 34 scholarly publications.
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KEYWORDS
Fiber Bragg gratings

Modulation

Reflectometry

Distortion

Metrology

Sensors

Amplitude modulation

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