2 May 2008 Metrological aspects of symmetric double frequency and multi frequency reflectometry for fiber Bragg structures
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Proceedings Volume 7026, Optical Technologies for Telecommunications 2007; 70260J (2008) https://doi.org/10.1117/12.801507
Event: Optical Technologies for Telecommunications 2007, 2007, Ufa, Russian Federation
Abstract
In paper metrological aspects of symmetric double frequency and multi frequency reflectometry for Bragg structures are considered. Basics of this method is amplitude phase conversion of coherent single frequency radiation to double frequency and its distinguished features are frequency-shifted spectral components symmetrical position relatively suppressed frequency of initial radiation, high level of spectral purity, stable output radiation, and high conversion ratio. In paper are considered the metrological aspects of following systems: a) symmetric multi frequency reflectometry system for Bragg structures control, and b) symmetric double frequency reflectometry system for Bragg structures.
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Oleg G. Morozov, Oleg G. Natanson, Dmitry L. Aybatov, Anvar A. Talipov, Vitalii P. Prosvirin, Alexei S. Smirnov, "Metrological aspects of symmetric double frequency and multi frequency reflectometry for fiber Bragg structures", Proc. SPIE 7026, Optical Technologies for Telecommunications 2007, 70260J (2 May 2008); doi: 10.1117/12.801507; https://doi.org/10.1117/12.801507
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