Translator Disclaimer
28 August 2008 Highly efficient heating assisted tip-enhanced Raman spectroscopy
Author Affiliations +
We present a tip-enhanced Raman spectroscopy (TERS) system that permits efficient illumination and detection of optical properties in the visible range to obtain high contrasts Raman signals from strained silicon (ε-Si) assembled on silicon germanium substrate using an edge filter. The cut-off investigation in a depolarized TERS configuration. We overshadow wavelength of the edge filter is tuned by changing the angle of incident beam to deliver high incident power and effectively collect scattered near-field signals for nanoscopic strong far-field background signals from Raman active materials by utilizing the results obtained from depolarized surface-enhanced Raman scattering experiments in conjunction with silicon Raman tensor calculation to quantify which polarizer, analyzer and sample azimuth combination gives the minimum far-field signals. Here, we utilize the s-polarization instead of p-polarized light in conjunction with polarization properties of ε-Si to obtain a high contrast Raman signal. We found that for imaging Raman active and bulk crystalline materials such as silicon, background signal suppression (s-illumination) is more important than the field enhancement with strong far-field signal levels (p-polarization). The utilization of an edge filter for shorter collection time, depolarized configuration for higher contrast and tip heating for higher resolution are discussed.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alvarado Tarun, Norihiko Hayazawa, Masashi Motohashi, and Satoshi Kawata "Highly efficient heating assisted tip-enhanced Raman spectroscopy", Proc. SPIE 7033, Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV, 70330C (28 August 2008);

Back to Top