9 September 2008 Effects of pattern size, dual side patterning, and imprint materials in the fabrication of antireflective structure using nanoimprint
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Abstract
One of the useful applications using NIL is the fabrication of antireflection structure (ARS) which has a sub-wavelength nanostructure similar to moth-eye below wavelength of visible light because the ARS can be used in anti-glare monitor, dashboards, and solar cells. The material selection of mold and resin in the NIL process for ARS is very important for the purpose of real application and mass production. Generally, the mold should have flexibility for continuous mass production and final structure should have strong durability under outdoor environment. In this work, the effect of single side and dual side patterning were investigated by change of pitch from moth-eye to photonic crystal on the flexible polymer substrate by using NIL. Then, the effect of fluorine resin with low refractive index was tested. Finally, a fabrication method of ARS of pitch of 250nm with high fidelity and accuracy using the high-resolution PDMS mold by aid of solvent mixing of low viscosity was presented. Generally, it is difficult for Sylgard PDMS to make nanopattern below 300nm pitch without special treatment.
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Dae-Geun Choi, Ki-Jung Lee, Ki-Don Kim, Jun-Hyuk Choi, Jun-Ho Jeong, Eung-Sug Lee, "Effects of pattern size, dual side patterning, and imprint materials in the fabrication of antireflective structure using nanoimprint", Proc. SPIE 7039, Nanoengineering: Fabrication, Properties, Optics, and Devices V, 70391E (9 September 2008); doi: 10.1117/12.794426; https://doi.org/10.1117/12.794426
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