9 September 2008 Ultra low capacitance high frequency IC probe
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Proceedings Volume 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II; 704203 (2008); doi: 10.1117/12.792137
Event: NanoScience + Engineering, 2008, San Diego, California, United States
Abstract
The high speed low capacitance probe presented here is a flexible / tailorable tool for internal node testing on Radio Frequency Integrated Circuits (RFIC). The probe utilizes the mutual capacitive coupling between two wires. In this case, a tungsten whisker and the inner conductor of a coaxial cable forms a capacitor, enabling extremely low probing (loading) capacitance. The mutual capacitance which can be modeled to the first order as a lumped element capacitor provides differentiating action. Viewing the derivative of the output signal, rise time and can be observed directly. Through the use of probe calibration and Fourier transforms the probed signal can be re-created. Probe calibration develops a transfer function enabling re-creation of time domain signals.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. E. Jacob, D. A. Miller, L. Forbes, "Ultra low capacitance high frequency IC probe", Proc. SPIE 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II, 704203 (9 September 2008); doi: 10.1117/12.792137; https://doi.org/10.1117/12.792137
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KEYWORDS
Capacitance

Capacitors

Tungsten

Fourier transforms

Calibration

3D modeling

Capacitive coupling

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