11 September 2008 Embossing of light trapping patterns in sol-gel coatings for thin film silicon solar cells
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Abstract
For thin-film silicon solar cells, light trapping schemes are of uppermost importance to harvest as much as possible of the available sunlight. Typically, one uses randomly textured front TCOs to scatter the light diffusively in pin-cells on glass. Here, we investigate methods to texture the back contact with both random and periodic textures for use in nip-cells on opaque foil. We applied an electrically insulating SiOx-polymer coating on a stainless steel substrate, and textured this barrier layer by embossing. On this barrier layer the back contact is deposited for further use in the solar cell stack. Replication of stamps with various random and periodic patterns was investigated, and, using scanning electron microscopy, replicas were found to compare well with the originals. Masters with U-grooves of various submicrometer widths have been used to investigate the optimum dimensions of regular patterns for light trapping in the silicon layers. Angular reflection distributions were measured to evaluate the light scattering properties of both periodic and random patterns. Diffraction gratings show promising results in scattering the light to specific angles, enhancing the total internal reflection in the solar cell.
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Maurits C. R. Heijna, Jochen Löffler, Bas B. Van Aken, Wim J. Soppe, Rob van Erven, Ronald Franken, Herman Borg, Patrick P. G. J. M. Peeters, "Embossing of light trapping patterns in sol-gel coatings for thin film silicon solar cells", Proc. SPIE 7047, Nanoscale Photonic and Cell Technologies for Photovoltaics, 704706 (11 September 2008); doi: 10.1117/12.794937; https://doi.org/10.1117/12.794937
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