Integrated quantum efficiency, topography, and stress metrology for solar cell manufacturing: real space approach

Wojtek J. Walecki; Fanny Szondy

doi:10.1117/12.792934

10 September 2008 Integrated quantum efficiency, topography, and stress metrology for solar cell manufacturing: real space approach

Wojtek J. Walecki, Fanny Szondy

Author Affiliations +

Proceedings Volume 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems; 704804 (2008) https://doi.org/10.1117/12.792934
Event: Solar Energy + Applications, 2008, San Diego, California, United States

Abstract

We report a new system for measurement of the spatially resolved quantum efficiency (QE) of the semiconductor solarcells. In our method solar-cell is illuminated by modified liquid crystal display projector scanner. System allows to measure photo-current, and optical properties of the illuminated surface. The same system can be also used to measure surface topography of the wafer, its bow, and warp, and calculate lateral stress in the structure if structure cross-section is known.

Citation Download Citation

Wojtek J. Walecki and Fanny Szondy "Integrated quantum efficiency, topography, and stress metrology for solar cell manufacturing: real space approach", Proc. SPIE 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems, 704804 (10 September 2008); https://doi.org/10.1117/12.792934

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